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Characteristics Measurement System Product List and Ranking from 5 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Aug 06, 2025～Sep 02, 2025
This ranking is based on the number of page views on our site.

Characteristics Measurement System Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Aug 06, 2025～Sep 02, 2025
This ranking is based on the number of page views on our site.

  1. オーシャンフォトニクス Tokyo//Testing, Analysis and Measurement
  2. キーコム Tokyo//Testing, Analysis and Measurement
  3. システムロード Kyoto//Testing, Analysis and Measurement
  4. 4 雄山 Tokyo//others 東京支店
  5. 4 新日本通商 Hyogo//Trading company/Wholesale
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Characteristics Measurement System Product ranking

Last Updated： Aggregation Period:Aug 06, 2025～Sep 02, 2025
This ranking is based on the number of page views on our site.

  1. Magnetic Material Property Measurement System 'PER01' キーコム
  2. Fluorescent Diffusion Characteristics Measurement System "OP-FL-GONIO-MN Series" オーシャンフォトニクス
  3. What is specular reflection? What is diffuse reflection? オーシャンフォトニクス
  4. Polarization Characteristic Measurement System 'PP8' システムロード
  5. 4 12-inch wafer compatible type CVmap3093 A/B 雄山 東京支店

Characteristics Measurement System Product List

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What is specular reflection? What is diffuse reflection?

What is specular reflection? What is diffuse reflection?

We will provide a detailed explanation of technical information regarding specular reflection and diffuse reflection.

Reflection is when light hits an object and bounces back. The reflection of light can be broadly classified into specular reflection and diffuse reflection. Additionally, all types of reflection, including specular and diffuse reflection, can also be referred to as total reflection. 【Specular Reflection】 Specular reflection refers to the phenomenon where the angle of incidence and the angle of reflection are equal with respect to the reflecting surface. Generally, mirrors and shiny or glossy objects exhibit strong characteristics of specular reflection. 【Diffuse Reflection】 Diffuse reflection refers to the scattering of incident light in various directions when it hits a rough surface. Generally, rough surfaces and objects that lack shine or gloss exhibit strong characteristics of diffuse reflection. *For more details, please refer to the PDF document or feel free to contact us.*

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Polarization Characteristic Measurement System 'PP8'

Polarization Characteristic Measurement System 'PP8'

Automatic evaluation of polarized spectra! A polarimetric measurement system capable of real-time display.

The "PP8" is a polarization characteristic measurement system that can automatically evaluate polarization degree, polarization spectrum, transmittance, color characteristics, and more, with real-time display capabilities. It supports various options and custom specifications, including fixtures tailored to samples and UV measurements for UV-A and UV-B. With comprehensive software, it supports the development and evaluation of LED modules, devices, and more. 【Features】 ■ Automatically evaluates polarization spectrum and color characteristics ■ Real-time display capability ■ Supports various options and custom specifications ■ Assists in the development and evaluation of LED modules, devices, etc. *For more details, please refer to the PDF materials or feel free to contact us.

  • Analytical Equipment and Devices

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Magnetic Material Property Measurement System 'PER01'

Magnetic Material Property Measurement System 'PER01'

Wide range measurement from 100 kHz to 30 GHz! Magnetic material property measurement system (including permeability).

The 『PER01』 is a system for measuring the complex permeability μr′ - iμ"r, half-width △H, ferromagnetic resonance relaxation coefficient α (100MHz-10GHz), and saturation magnetization 4πMs over a wide frequency range. By setting a disk or square plate sample in a short-circuited microstrip line and using a vector network analyzer for frequency sweeping, high-precision measurements can be achieved through a simple operation. Measurements can be conducted from 100kHz to 30GHz. Please also take advantage of our measurement (analysis contract testing) services. 【Features】 ■ Capable of wide-range measurements from 100kHz to 30GHz ■ Simple operation ■ High-precision measurements possible *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Other electronic measuring instruments

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Fluorescent Diffusion Characteristics Measurement System "OP-FL-GONIO-MN Series"

Fluorescent Diffusion Characteristics Measurement System "OP-FL-GONIO-MN Series"

Easy setup for the angles of irradiation and light reception! Measurement system for the photometric distribution characteristics (fluorescent light distribution characteristics).

The "OP-FL-GONIO-MN series" is a spectral measurement system that can measure the diffusion characteristics of fluorescence. We propose suitable excitation light sources such as LEDs and lasers according to the excitation wavelength you are considering. The irradiation (excitation) and detection axes can be manually set to any angle for measurement. Additionally, we offer options for software customization and system automation. 【Features】 ■ Achieves cost-effective and simple measurement of the fluorescence diffusion (fluorescence distribution characteristics) of phosphor samples. ■ Easy manual control of the angles for irradiation (excitation) and detection. ■ Proposals for excitation light sources (LEDs, lasers, etc.) tailored to your needs. ■ Custom sample holders made to fit your samples. ■ Support for software and hardware customization, as well as system automation. *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices
  • Spectroscopic Analysis Equipment
  • Other inspection equipment and devices

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12-inch wafer compatible type CVmap3093 A/B

12-inch wafer compatible type CVmap3093 A/B

12-inch wafer compatible type

This is a CV/IV measurement system using a mercury probe method that excels in reproducibility and safety. It can measure the characteristics of various types of wafers, including Si, compounds, SOI, SiC, and bulk wafers. Users can specify up to 49 measurement sites, enabling mapping measurements of C-V, I-V characteristics, TDDB, Vbd, Qbd oxide breakdown evaluation, Dit, doping concentration, oxide film thickness, Low-k, High-k, and more.

  • Other environmental analysis equipment

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Online Strength Characteristic Measurement System "PSM-Q"

Online Strength Characteristic Measurement System "PSM-Q"

Online strength property measurement system utilizing ultrasonic technology for the paper industry.

It is now possible to measure the strength characteristics that were previously measured/predicted over time using laboratory equipment and soft sensors in real-time online. Various strength indicators can be measured every 2 seconds and visualized in trend graphs. By monitoring and optimizing strength changes due to the addition of agents in real-time, it is possible to reduce costs and stabilize quality.

  • Other measurement, recording and measuring instruments
  • Paper and pulp

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